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Conferences

  • Z. Hatab, E. Leitgeb and M. E. Gadringer, “Broadband Characterization of Co-planar GSG Wirebonds for RF Heterogeneous 2.5D Integration,” 2021 97th ARFTG Microwave Measurement Conference (ARFTG), Atlanta, GA, USA, 2021, pp. 1-4, doi: 10.1109/ARFTG52261.2021.9640137.

  • Z. Hatab, M. Gadringer and W. Bösch, “Improving The Reliability of The Multiline TRL Calibration Algorithm,” 2022 98th ARFTG Microwave Measurement Conference (ARFTG), Las Vegas, NV, USA, 2022, pp. 1-5, doi: 10.1109/ARFTG52954.2022.9844064.

  • Z. Hatab, M. Gadringer and W. Bosch, “A Simple Design Pattern for T4R Calibration Method,” 2022 Microwave Mediterranean Symposium (MMS), Pizzo Calabro, Italy, 2022, pp. 1-4, doi: 10.1109/MMS55062.2022.9825500.

  • Y. Liu, Z. Hatab, E. Leitgeb and P. Wang, “Experimental Coupling Loss Analysis of Free Space Optical Link under different Weather Conditions,” 2022 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications (CoBCom), Graz, Austria, 2022, pp. 1-4, doi: 10.1109/CoBCom55489.2022.9880792.

  • Z. Hatab, H. Takahashi, M. Gadringer and W. Bosch, “OFDM Symbol-timing and Carrier-frequency Offset Estimation Based on Singular Value Decomposition,” 2022 International Conference on Broadband Communications for Next Generation Networks and Multimedia Applications (CoBCom), Graz, Austria, 2022, pp. 1-4, doi: 10.1109/CoBCom55489.2022.9880699.

  • H. Takahashi, Z. Hatab, E. Schlaffer, H. Paulitsch and W. Bösch, “Experimental Characterization of Microvias Using TRL Calibration with Uncertainty Analysis,” 2022 Asia-Pacific Microwave Conference (APMC), Yokohama, Japan, 2022, pp. 411-413, doi: 10.23919/APMC55665.2022.9999955.

  • Z. Hatab, A. B. Alothman Alterkawi, H. Takahashi, M. Gadringer and W. Bösch, “Low-return Loss Design of PCB Probe-to-Microstrip Transition for Frequencies up to 150 GHz,” 2022 Asia-Pacific Microwave Conference (APMC), Yokohama, Japan, 2022, pp. 208-210, doi: 10.23919/APMC55665.2022.9999913.

  • Z. Hatab, M. Gadringer and W. Bösch, “Propagation of Measurement and Model Uncertainties through Multiline TRL Calibration,” 2022 Conference on Precision Electromagnetic Measurements (CPEM), Wellington, New Zealand, 2022, pp. 1-2, doi: N/A, e-print doi: 10.48550/arXiv.2206.10209.

  • Z. Hatab, H. Takahashi, A. B. Alothman Alterkawi, M. E. Gadringer and W. Bösch, “A Quasi-TEM Approach for Designing Microvias for PCB Layer Transition with Minimal Return Loss,” 2023 53rd European Microwave Conference (EuMC), Berlin, Germany, 2023, pp. 62-65, doi: 10.23919/EuMC58039.2023.10290259.

  • B. Schafsteller, M. Schwaemmlein, M. Rosin, G. Ramos, Z. Hatab, M.E. Gadringer, E. Schlaffer, “Investigating the Impact of Final Finishes on the Insertion Loss in As Received and After Aging,” IMAPSource Proceedings, vol. 2023, no. Symposium, pp. 294–299, Feb. 2024, doi: 10.4071/001c.94519.

  • Z. Hatab, M. E. Gadringer and W. Bösch, “Error-Box Calibration of Three-Sampler VNAs,” 2024 102nd ARFTG Microwave Measurement Conference (ARFTG), San Antonio, TX, USA, 2024, pp. 1-4, doi: 10.1109/ARFTG59840.2024.10460715.

Articles

  • Z. Hatab, M. Gadringer, M. Habib and W. Bösch, “mm-Wave Complex Permittivity Extraction of LTCC Substrate Under the Influence of Surface Roughness,” in IEEE Transactions on Instrumentation and Measurement, vol. 71, pp. 1-11, 2022, doi: 10.1109/TIM.2022.3152319.

  • Z. Hatab, A. Abdi, G. Steinbauer, M. E. Gadringer, and W. Bösch, “Propagation Constant Measurement Based on a Single Transmission Line Standard Using a Two-Port VNA,” Sensors, vol. 23, no. 9, p. 4548, May 2023, doi: 10.3390/s23094548, e-print doi: 10.48550/arXiv.2302.13859.

  • Z. Hatab, M. E. Gadringer and W. Bösch, “Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration,” in IEEE Transactions on Instrumentation and Measurement, vol. 72, pp. 1-9, 2023, doi: 10.1109/TIM.2023.3296123, e-print doi: 10.48550/arXiv.2301.09126.

  • Z. Hatab, M. E. Gadringer and W. Bösch, “A Thru-free Multiline Calibration,” in IEEE Transactions on Instrumentation and Measurement, vol. 72, pp. 1-9, 2023, doi: 10.1109/TIM.2023.3308226, e-print doi: 10.48550/arXiv.2305.03597.

  • Z. Hatab, M. E. Gadringer, A. B. Alothman Alterkawi and W. Bösch, “Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards,” in IEEE Open Journal of Instrumentation and Measurement, vol. 2, pp. 1-12, 2023, doi: 10.1109/OJIM.2023.3315349, e-print doi: 10.48550/arXiv.2209.09163.

  • Z. Hatab, M. E. Gadringer and W. Bösch, “Indirect Measurement of Switch Terms of a Vector Network Analyzer with Reciprocal Devices,” in IEEE Microwave and Wireless Technology Letters, 2023, doi: 10.1109/LMWT.2023.3311032, e-print doi: 10.48550/arXiv.2306.07066.

  • H. Takahashi, Z. Hatab, E. Schlaffer, H. Paulitsch, and W. Bösch, “Experimental analysis of grounded coplanar waveguide structures based on different PCB processes with uncertainty analysis” IEICE Electronics Express, 2023, doi: 10.1587/elex.20.20230381.

  • Z. Hatab, M. E. Gadringer and W. Bösch, “Symmetric-Reciprocal-Match Method for Vector Network Analyzer Calibration,” in IEEE Transactions on Instrumentation and Measurement, vol. 73, pp. 1-11, 2024, Art no. 1001911, doi: 10.1109/TIM.2024.3350124, e-print doi: 10.48550/arXiv.2309.02886.

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